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PhD Researcher in Nanoscale Metrology

1 maand geleden


Amsterdam, Noord-Holland, Nederland ARCNL Voltijd

You are invited to contribute to the development of innovative metrology techniques for the semiconductor industry at ARCNL, a leading research institute located at Amsterdam Science Park.

Job Description

This PhD position is focused on creating new concepts for imaging and metrology by integrating computational imaging, multimode fibers, lensless microscopy, and advanced light control in complex media. You will work on enabling fast and accurate characterization of 3D multi-layer nanostructures.

Responsibilities
  • Develop new approaches to sparsity-based subwavelength imaging through optical fibers
  • Connect modern research areas such as computational imaging, complex wavefront shaping, compressive sensing, and metrology
  • Pave the way for better metrology tools for tomorrow's nanolithography
Requirements

To be eligible for this position, you should have (or soon will have) a MSc in physics or applied physics. Knowledge of computational microscopy, experimental optics, and/or semiconductor metrology is advantageous. Programming skills in Python or Matlab are welcomed. Good verbal and written communication skills in English are required.

What We Offer

The appointment is intended as full-time (40 hours/week, 12 months/year) for four years, with a starting salary of € 27,781 per month. ARCNL assists foreign PhD-students with housing, visa applications, transport costs, and furnishing expenses. Several courses are offered specially developed for PhD-students. A PhD degree will be granted at a Dutch University after successful completion of the research.